![[Audio] ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)](https://nanohub.org/site/resources/2009/09/07320/itunes_audio.png "[Audio] ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)")
Claim Ownership[Audio] ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)
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Description
A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.
25 Episodes
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Topics:Multi-Frequency AFMUsing Tuned CantileversMomentary ExcitationPlease note: the slides for this lecture were accidentally lost and a scanned copy of the slide handouts is used. Eventually this lecture will be replaced with a re-constructed set of slides and will be of a quality similar to the other lectures in this course.
From interatomic and intermolecular forces to tip-sample interaction forces.
Topics:Probe Tip ArtifactsInstrumental ArtifactsLarge Force ArtifactsImage Processing ArtifactsIntrinsic LimitationsTip Cleaning
Topics:Unifying ThemeTaking advantage of cantilever modes
Topics:FM-AFM Selected Results/li>Achieving Atomic Resolution with AFM
Topics:Multi-frequency AFMSub-surface imagingHigh-speed/video rate AFM
Topics:STM – early workArranging atoms with a tipLocal Oxidation Lithography (Electrochemical)Dip Pen LithographyNanografting
Topics:Scanning Tunneling Spectroscopy (STS)Current Imaging Tunneling Spectroscopy (CITS)Apparent barrier heightForce on the tipAtomic CorrugationQuantum Corrals
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